ESD testing : from components to systems / Steven H. Voldman, IEEE Fellow, New York, USA.

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TextSeries: ESD series | ESD seriesPublisher: Chichester, West Sussex, United Kingdom : Wiley, 2017Description: xxiv, 297 pages ; 26 cmContent type:

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Holdings
Item type	Current library	Collection	Shelving location	Call number	Status	Date due	Barcode
Book	TUP Manila Library	NFIC	New Acquisitions-Ground floor	TK 7870.285 V65 2017 (Browse shelf(Opens below))	Available		P00031843

Includes bibliographical references and index.

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