| 000 | 02149nam a22003735i 4500 | ||
|---|---|---|---|
| 001 | 20898504 | ||
| 003 | OSt | ||
| 005 | 20240805104731.0 | ||
| 008 | 190321s2019 nju 000 0 eng | ||
| 010 | _a 2019937605 | ||
| 020 | _a9780135732410 (pbk. : alk. paper) | ||
| 040 |
_aDLC _beng _erda _cTUPM |
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| 042 | _apcc | ||
| 050 | 0 |
_aTK 7874.75 _bD55 2019 |
|
| 100 | 1 | _aDillinger, Thomas E. | |
| 245 | 0 | 0 |
_aVlsi design methodology development / _cThomas E. Dillinger. |
| 250 | _a1st edition. | ||
| 263 | _a1907 | ||
| 264 | 1 |
_aHoboken, NJ : _bPearson Education, Inc., _c2019. |
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| 300 |
_a xvii, 734 pages : _billustrations ; _c24 cm |
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| 336 |
_atext _btxt _2rdacontent |
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| 337 |
_aunmediated _bn _2rdamedia |
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| 338 |
_avolume _bnc _2rdacarrier |
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| 504 | _aIncludes index and bibliographical references | ||
| 505 | 0 | _aIntroduction VLSI Design methodology Hierarchical design decomposition Cell and IP modeling Characteristics of functional validation Characteristics of formal equivalency verification Logic synthesis Placement Routing Layout parasitic extraction and electrical modeling Timing analysis Noise analysis Power analysis Power rail voltage drop analysis Electromigration (EM) reliability analysis Miscellaneous electrical analysis requirements ECOs Physical design verification Design for testability analysis Preparation for tapeout Post-silicon debug and characterization ("bring-up") and product qualification | |
| 520 | _aAs microelectronics engineers design complex chips using existing circuit libraries, they must ensure correct logical, physical, and electrical properties, and prepare for reliable foundry fabrication. VLSI Design Methodology Development focuses on the design and analysis steps needed to perform these tasks and successfully complete a modern chip design. | ||
| 650 | 1 | 0 |
_aIntegrated circuits _xVery large scale integration |
| 650 | 1 | 0 | _aIntegrated circuits |
| 650 | 1 | 0 | _aMicroelectronics |
| 906 |
_a0 _bibc _corignew _d2 _eepcn _f20 _gy-gencatlg |
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| 942 |
_2lcc _cBK |
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| 999 |
_c3597 _d3597 |
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